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Surface Infrared and Raman Spectroscopy: Methods and Applications: 3 (Methods of Surface Characterization) - Hardcover
Inhaltsangabe
are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.
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Reseña del editor
are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.
Reseña del editor
Written with engineers and researchers in mind, author W. Suëtka offers a well-illustrated, basic reference on the use of infrared (IR) and Raman spectroscopy in the investigation of surfaces of practical materials. This book only requires a basic knowledge of vibrational spectroscopy for understanding the included discussions. Chapters illustrate applications of IR and Raman spectroscopy in the investigation of a variety of real surfaces. Featured in this volume are the typical results obtained for species on clean and well-defined surfaces in ultrahigh vacuum environments.
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Surface infrared and Raman spectroscopy. Methods and applications.
Anbieter: Antiquariat Bookfarm, Löbnitz, Deutschland
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Hardcover. 270 S. Ehem. Bibliotheksexemplar mit Bib.-Signatur und Stempel in GUTEM Zustand. Kaum Gebrauchsspuren. 9780306449635 Sprache: Englisch Gewicht in Gramm: 550. Artikel-Nr. 2143056
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Surface Infrared and Raman Spectroscopy: Methods and Applications
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
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Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780306449635. Artikel-Nr. 9208837
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Surface Infrared and Raman Spectroscopy: Methods and Applications
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Hardcover. Zustand: Fair. No Jacket. Former library book; Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less 1.2. Artikel-Nr. G0306449633I5N10
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Surface Infrared and Raman Spectroscopy: Methods and Applications(Methods of Surface Characterization, 3)
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
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Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,600grams, ISBN:0306449633. Artikel-Nr. 5835161
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Surface Infrared and Raman Spectroscopy - Methods and Applications
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
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Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-91920
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Surface Infrared and Raman Spectroscopy
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Springer US, Springer US Mai 1995, 1995
ISBN 10: 0306449633
ISBN 13: 9780306449635
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Buch. Zustand: Neu. Neuware -are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 284 pp. Englisch. Artikel-Nr. 9780306449635
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Surface Infrared and Raman Spectroscopy
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Zustand: Used. pp. 288. Artikel-Nr. 18524474
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Surface Infrared and Raman Spectroscopy
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Zustand: Used. pp. 288 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam. Artikel-Nr. 8372079
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Surface Infrared and Raman Spectroscopy : Methods and Applications
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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr. Artikel-Nr. 9780306449635
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Surface Infrared and Raman Spectroscopy: Methods and Applications (Methods of Surface Characterization, 3)
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