Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
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C. Julian Chen is at IBM Thomas J. Watson Research Center.Review:
".... Will become a 'bible' for STM students." --John Pethica, University of Oxford
"It will be of great use to the scientific community, particularly for new researchers getting started in the field of STM. . . . The theoretical section is extremely comprehensive . . . . The chapters on instrumentation are excellent. For someone considering building an STM or trying to
understand exactly what the parts of his commercial instrument do, these chapters are indispensable." --Shirley Chiang, IBM
"A remarkable achievement . . . . A beautiful piece of work." --Andrew Briggs, University of Oxford
"It is an excellent book which will benefit students and scientists alike." --Tien T. Tsong, Pennsylvania State University
"Provides a good introduction to the field for newcomers and also contains valuable material and hints for experts." --H. Rohrer, IBM
"This is a very impressive work that will certainly be appreciated by the growing STM community as well as newcomers to the field. . . . . The answers to some basic questions are sometimes impossible to find in research papers. It is very appropriate that a comprehensive, single-author view,
containing all aspects of the field, appear in print. I know of few researchers that could have so well succeeded in expounding theory, experiment, and instrumentation with such ease." William Sacks, Universite Pierre et Marie Curie, Paris
"A basic textbook and reference book has become available to the scientific community only recently. . . . Chen closes a distinct gap in the published data in this field. . . . is a beautifully illustrated reference book for physicists and engineers." --Andreas Engel, Scanning
"An exhaustive discussion of atomic scale imaging. . . . the book is clearly written and thoroughly referenced, and many researchers using STM will find the book worth purchasing." --David G. Cahill (Univ of Illinois), Microscopy Research and Technique
"Not only presents an overview of the field of probe microscopy, but provides the reader with a fairly comprehensive reference source. The mathematics used in the text appears useful to helping the reader understand the STM and is presented in a straight-forward manner. . . . a valuable
text/reference book for all those interested in learning about probe microscopy." --Samuel H. Cohen and Louis Piscitello, Scanning Microscopy Intl
"An excellent book....Introductory, yet comprehensive....Suitable for use as a textbook in the senior undergraduate and graduate levels, as well as a reference book for students and professionals interested in the building, operation, or use of scanning tunneling and related microscopes.
Potential readers of the book could include physicists, chemists, biologists, materials scientists/engineers, electrical engineers, chemical engineers, and mechanical engineers....Well-organized and well written. It features a large number of illustrations, including beautiful STM photographs. The
typography is excellent." --D.D.L. Chung, SUNY Buffalo, Journal of Minerals, Metals and Materials Society
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