Solid State Electronic Devices: United States Edition - Hardcover

Über die Autorin bzw. den Autor

BEN G. STREETMAN is Dean of the College of Engineering at The University of Texas at Austin and holds the Dula D. Cockrell Centennial Chair in Engineering. He is a Professor of Electrical and Computer Engineering and was the founding Director of the Microelectronics Research Center. He has taught at the University of Illinois at Urbana-Champaign as well as the University of Texas at Austin. He has received numerous awards including the Education Medal of IEEE, The Frederick Emmons Terman Medal of the ASEE, and membership in the National Academy of Engineering. He has published more than 270 articles in the technical literature. Thirty-three students of Electrical Engineering, Materials Science, and Physics have received their Ph.D.s under his direction.

SANJAY BANERJEE is the Cullen Trust Endowed Professor of Electrical and Computer Engineering, and Director of the Microelectronics Research Center at The University of Texas at Austin. He has more than 225 archival refereed publications and 12 U.S. patents, and has supervised 18 Ph.D. students. His honors include the NSF Presidential Young Investigator Award (1988), the Texas Atomic Energy Centennial Fellowship (1990-1997), Distinguished National Lecturer for the IEEE Electron Devices Society (1997-), and Fellow of the IEEE (1996).

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This book is designed to help readers gain a basic understanding of semiconductor devices and the physical operating principles behind them. This two-fold approach 1) provides the user with a sound understanding of existing devices, and 2) helps them develop the basic tools with which they can later learn about applications and the latest devices. The piece provides one of the most comprehensive treatments of all the important semiconductor devices, and reflects the most current trends in the technology and theoretical understanding of the devices.

FEATURES/BENEFITS

• NEW―Thoroughly updated to reflect the most current trends in the technology and theoretical understanding of devices.
• NEW―Expanded description of silicon Czochralski growth, wafer production, and vapor phase epitaxy (Ch. 1).
• NEW―Clearer discussion of chemical bonding, energy band formation and hole transport (Chs. 2, 3 and 4).
• NEW―Consolidated coverage of p-n junction diodes and its applications (Ch. 5).
• NEW―Greatly expanded/updated discussion of device fabrication processes (Ch. 5 and appendices).
• NEW―Earlier discussion of MOS devices (Ch. 6)―Ahead of bipolar junction transistors―reflects the preponderance of complementary MOS field effect transistors (MOSFETs) in integrated circuits today.
• NEW―Major revision of chapter on Field Effect Transistors (Ch. 6)―Both in the underlying theory as well as discussion of a variety of short channel, high field and hot carrier effects in scaled, ultra-small MOSFETs. Includes extensive discussions of the current-voltage and capacitance-voltage characteristics of these devices―and the information that can be gleaned from such measurements.
• NEW―Updated chapter on Bipolar Junction Transistors (BJTs) (Ch. 7)―To reflect current technology. Describes higher-order effects (including the Kirk effect and Webster effect); discusses the Gummel-Poon model (which is more elaborate and physically more accurate than the Ebers-Moll model); and updates the fabrication aspects of BJTs.
• NEW―Consolidated coverage of optoelectronic devices in a single chapter (Ch. 8)―Brings the discussion of semiconductor lasers into the same chapter as LEDs and detectors
• Reflects the growing importance of optoelectronics.
• NEW―Updated coverage of integrated circuits (Ch. 9)―Eliminates outdated material on bipolar processes to reflect the concerted shift to CMOS applications, such as logic and memory integrated circuits.
• NEW―A section on the insulated gate bipolar transistor (Ch. 11)―A device that is gradually supplanting the semiconductor-controlled rectifier.
• NEW―Real data―Wherever feasible, replaces idealized current-voltage and capacitance-voltage plots with real data.