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Verlag: Chronicle Books 2015-08-04, San Francisco, 2015
ISBN 10: 1452145687ISBN 13: 9781452145686
Anbieter: Blackwell's, London, Vereinigtes Königreich
Buch
paperback. Zustand: New. Parra, John (illustrator). Language: ENG.
Verlag: Chronicle Books 2016-08-02, San Francisco, 2016
ISBN 10: 145215645XISBN 13: 9781452156453
Anbieter: Blackwell's, London, Vereinigtes Königreich
Buch
paperback. Zustand: New. Parra, John (illustrator). Language: ENG.
Verlag: Chronicle Books 2019-04-02, San Francisco, 2019
ISBN 10: 1452155844ISBN 13: 9781452155845
Anbieter: Blackwell's, London, Vereinigtes Königreich
Buch
hardback. Zustand: New. Parra, John (illustrator). Language: ENG.
Verlag: Chronicle Books 2013-04-01, San Francisco, 2013
ISBN 10: 1452106169ISBN 13: 9781452106168
Anbieter: Blackwell's, London, Vereinigtes Königreich
Buch
hardback. Zustand: New. Parra, John (illustrator). Language: ENG.
Verlag: Springer New York, 1993
ISBN 10: 0306443600ISBN 13: 9780306443602
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
Verlag: Springer US, 2013
ISBN 10: 1489915249ISBN 13: 9781489915245
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.