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Verlag: Springer, 1999
ISBN 10: 0792384660ISBN 13: 9780792384663
Anbieter: Better World Books, Mishawaka, IN, USA
Buch Erstausgabe
Zustand: Very Good. 1st. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects.
Verlag: Kluwer Academic, 1999
ISBN 10: 0792384660ISBN 13: 9780792384663
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Buch
Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9780792384663.
Verlag: Kluwer Academic, 1999
ISBN 10: 0792384660ISBN 13: 9780792384663
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Buch
Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9780792384663.
Verlag: Kluwer Academic, 1999
ISBN 10: 0792384660ISBN 13: 9780792384663
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Buch
Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9780792384663.
Verlag: Springer US, 1999
ISBN 10: 0792384660ISBN 13: 9780792384663
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.