Bayesian Multiple Target Tracking, Second Edition - Hardcover

9781608075539: Bayesian Multiple Target Tracking, Second Edition
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Bayesian Multiple Target Tracking, 2Nd Edition, Lawrence D. Stone , Roy L. Streit, 9781608075539, Artech House, 2014, Hardcover

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Reseña del editor:
This book views multiple target tracking as a Bayesian inference problem. Within this framework it develops the theory of single target tracking, multiple target tracking, and likelihood ratio detection and tracking. In addition to providing a detailed description of a basic particle filter that implements the Bayesian single target recursion, this resource provides numerous examples that involve the use of particle filters. With these examples illustrating the developed concepts, algorithms, and approaches -- the book helps radar engineers track when observations are nonlinear functions of target site, when the target state distributions or measurement error distributions are not Gaussian, in low data rate and low signal to noise ratio situations, and when notions of contact and association are merged or unresolved among more than one target.
Biografía del autor:
Lawrence D. Stone is chief scientist at Metron, Inc. He received his Ph.D. and MS in mathematics from Purdue University. Roy Streit is a senior scientist at Metron, Inc. He earned his Ph.D. in mathematics from the University of Rhode Island. Thomas L. Corwin is president, chief operating officer, and board chairman of Metron Inc. He received his Ph.D and MS in statistics from Princeton University. Kristine Bell is a senior scientist at Metron, Inc. She received her PhD in information technology from GMU.

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  • VerlagArtech House
  • Erscheinungsdatum2014
  • ISBN 10 1608075532
  • ISBN 13 9781608075539
  • EinbandTapa dura
  • Anzahl der Seiten320

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Stone, Lawrence D.|Streit, Roy L.|Corwin, Thomas L.
Verlag: ARTECH HOUSE INC (2014)
ISBN 10: 1608075532 ISBN 13: 9781608075539
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Buchbeschreibung Zustand: New. &Uumlber den AutorLawrence D. Stone is chief scientist at Metron, Inc. He received his Ph.D. and MS in mathematics from Purdue University. Roy Streit is a senior scientist at Metron, Inc. He earned his Ph.D. in mathematics from the Univ. Artikel-Nr. 904484949

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